The AMCF Materials Characterization School was held the week of August 13th, 2012 at the Institute of Nanoscience & Engineering.
Participants attended lectures, practical laboratories and demonstrations on 5 facility instruments
(TEM, XRD, SEM, AFM & XPS).
All Participants had a wonderful time at the Institute and all expressed a strong desire to return. The feedback provided by the Participants can attest of the high quality of the presentations and laboratories and will help the School grow and adjust to specific interests in future events.
The success of the School was not only the result of the Facility Staff dedication to the Participant’s learning experience, starting months ahead of the event. None of it would have been possible without the precious contribution of the Institute Staff and the outstanding support from Dr Greg Salamo, Head of the Institute.
Thank you to all Participants and Contributors for making this happen !!!
Mourad Benamara
Material Characterization School
XPS demonstration with Tim Morgan
AFM demonstration with Yusuke Hirono
XRD-1 lecture by Mike Hawkridge
XPS lab
AFM lab
AFM lecture by Yusuke Hirono
XRD demonstration with Mike Hawkridge